报告题目：Failure Analysis in High-Tech Industry

报告 人：龚政 (Jane Gong)

时 间：4月21日（周四）下午2：30

地 点：电子信息学院学术报告厅

内容简介：In today’s competitive high technology industry, failure analysis and prevention are important functions to all of the engineering disciplines. Failure analysis of electronics requires specialized equipment and knowledge of cause and effect relationships to discover how and why failures occur. Performing the correct tests in the proper sequence is critical to determine the cause of a failure without removing vital evidence. Failure analysis conclusions should include objective recommendations for corrective actions. A closed-loop corrective action is taking on an increasingly important role as companies strive to achieve a world-class leadership position in their industry.

报告人简介：